• Monitoring of Vapor Uptake by Refractive Index and Thickness Measurements in Thin Films 

      Chen, Weijian; Saunders, John E.; Barnes, Jack A.; Yam, Scott S.-H.; Loock, Hans-Peter (2016-03-04)
      We report a method for real-time monitoring of vapor uptake by simultaneous detection of the refractive index, 𝑛 , and thickness, 𝑑 , of thin transparent films with a precision of 𝛿𝑛=10 −4 and 𝛿𝑑<100  nm . The setup ...