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dc.contributor.authorChen, Weijian
dc.contributor.authorSaunders, John E.
dc.contributor.authorBarnes, Jack A.
dc.contributor.authorYam, Scott S.-H.
dc.contributor.authorLoock, Hans-Peter
dc.date.accessioned2016-03-04T20:22:16Z
dc.date.available2016-03-04T20:22:16Z
dc.date.issued2016-03-04
dc.identifier.other10.1364/OL.38.000365
dc.identifier.urihttp://hdl.handle.net/1974/14107
dc.description.abstractWe report a method for real-time monitoring of vapor uptake by simultaneous detection of the refractive index, 𝑛 , and thickness, 𝑑 , of thin transparent films with a precision of 𝛿𝑛=10 −4 and 𝛿𝑑<100  nm . The setup combines total internal reflection (Abbé) refractometry with an interferometric imaging method. A fast Fourier transform and phase fitting method is applied for accurate and independent determination of refractive indices and thicknesses. While the uptake of acetone vapor by polydimethylsiloxane is investigated, the system is also suited for characterization of other solid and liquid films.en_US
dc.language.isoenen_US
dc.subjectVapor Uptakeen_US
dc.subjectRefractive Indexen_US
dc.subjectThickness Measurementsen_US
dc.subjectThin Filmsen_US
dc.titleMonitoring of Vapor Uptake by Refractive Index and Thickness Measurements in Thin Filmsen_US
dc.typejournal articleen_US


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